<?xml version="1.0" encoding="UTF-8"?><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
<dc:title>Supplemental material to 'Analysing dust particle size and size distribution on extracted particles by SEM and comparing with light scattering techniques'</dc:title>
<dc:creator>Petersen, Andreas</dc:creator>
<dc:contributor>Greiner, Franko</dc:contributor>
<dc:contributor>Wötzel, Jakob</dc:contributor>
<dc:type>research_data</dc:type>
<dc:type>database</dc:type>
<dc:identifier>https://doi.org/10.57892/100-52</dc:identifier>
<dc:identifier>https://opendata.uni-kiel.de/receive/fdr_mods_00000052</dc:identifier>
<dc:relation>info:eu-repo/grantAgreement/DFG/418187010/GR 1608%2F8-1414 &amp; WO 857%2F19-1 /EU/Staubige Plasmen mit hoher Elektronenverarmung: Untersuchung fundamentaler Mechanismen und Eigenschaften mittels Teilchen- und Plasmadiagnostik/DFG project 418187010 grants GR 1608%2F8-1414 and WO 857%2F19-1</dc:relation>
<dc:identifier>https://opendata.uni-kiel.de/receive/fdr_mods_00000052</dc:identifier>
<dc:type>doc-type:ResearchData</dc:type>
<dc:subject>ddc:530</dc:subject>
<dc:subject>dust, extraction, particle-size distribution, plasma polymerization, scanning electron microscopy (SEM)</dc:subject>
<dc:description>The presented data is supplemental material to the publication 'Analysing dust particle size and size distribution on extracted particles by SEM and comparing with light scattering techniques' (DOI: 10.1002/ppap.202400032) in Plasma Processes and Polymers published by Wiley‐VCH GmbH. The article describes six nearly identical cycles (numbered Set_1-6). In each amorphous hydrogenated carbon nanoparticles formed in a low temperature, low pressure discharge by plasma polymerization. The growth of the particles was monitored and eight consecutive samples per cycle were taken (numbered Extraction_1-8). For each sample scanning electron microscopy images of parts (Part_1-x) of the sample wafers were taken at a fixed magnification of 3000, which equals 12.4 nm per pixel. These images make up the first part . In a next step the particles were identified with the Hough transform-based routine , which is part of . The resulting data is stored in the second part . Lastly, from this analysis the particle size distribution (PSD) is modeled as a normal distribution. While in the publication a subset is presented for discussion, here the full histogram set can be accessed. It is found in</dc:description>
<dc:date>2024-04-17</dc:date>
<dc:language>eng</dc:language>
<dc:rights>https://opendatacommons.org/licenses/odbl/1-0/</dc:rights>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
</oai_dc:dc>
